D/teX-EDD

Features

• 2 mm x 12 mm active detector area
• Entire beam of a long fine focus X-ray tube contributes to the XRD measurement
• Ultra low noise JFET
• Linear up to 50,000 counts per second
• Peltier cooled for minimal maintenance
• Eliminates reflectivity loss associated with use of a diffracted beam monochromator
• Results in higher count rates for shorter measurement times

Image courtesy of MOXTEK, Inc.