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Rigaku Journal

The Rigaku Journal is a semiannual journal published by the Rigaku Corporation to serve the X-ray analysis community in general, and to serve Rigaku instrumentation users in particular. The Rigaku Journal is a scientific and technical journal, publishing articles relating to a wide range of X-ray diffraction and fluorescence applications.

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The Rigaku Journal Volume 1 No. 1/May 1984

Title	Authors	Size
Preface	H. Jagodzinski	231820
Foreword	M. M. Woolfson	44331
Contributed Papers
New Initiatives in the Solution of Difficult Structures: Gradient Refinement Techniques Applied to Direct Methods of Solving the Phase Problem	H. Wright	214796
Liquid to Crystal Ordering in HNO₃ Intercalated Single Crystal Graphite	E. J. Samuelsen, R. Moret and R. Comes	682538
Product Information
New X-ray Diffractometer System D/max-B Series		288697
Automatic X-ray Stress Analyzer "Strainflex" Series MSF-2M, PSF-2M		1495684
Computer-controlled X-ray Topographic Imaging System		260546
Curved PSPC Microdiffractiometer		400897
Automatic Piezo Goniometer System for Si Wafers		228032
The Editor's Postscript	Y. Shimura	7454

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