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The Rigaku Journal is a semiannual journal published by the Rigaku Corporation to serve the X-ray analysis com­munity in general, and to serve Rigaku instru­men­tation users in particular. The Rigaku Journal is a scientific and technical journal, publishing articles relating to a wide range of X-ray diffraction and fluorescence applications.
 
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The Rigaku Journal Volume 19 No. 1/May 2002

Contents Author Bytes
Preface C. Lecomte 50347
Contributed papers
Microfocusing Source and Multilayer Optics Based X-ray Diffraction Systems B. Verman, L. Jiang and B. Kim 321393
Influence of Crystal Structure on Molecular Structure: Syntactic Structural Chemistry E. R. T. Tiekink 1965512
Debate on Some Algorithms Relating Concentration to Intensity in XRF Spectrometery R. M. Rousseau 83738
A Newly Developed High-Temperature Chamber for in situ X-ray Diffraction: Setup and Calibration Procedures

M. Dapiaggi, G. Artioli and L. Petras

597781
Radial Shrinkage of Single-walled Carbon Nanotube Bundles at High Temperatures Y. Yosida 619782
Model Peak Profile functions for Powder Diffractometry as Convolutions with Instrumental Functions T. Ida 514461

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