Optics for wavelength dispersive spectroscopy
One of the most powerful tools in materials characterization is wavelength dispersive spectroscopy (WDS). In this technique, samples are typically investigated using two primary methods: electron probe microanalysis (EPMA) or wavelength dispersive X-ray fluorescence (WDXRF) spectroscopy.
In electron probe microanalysis, an electron beam striking a sample excites the production of characteristic X-rays for each element in that sample. In wavelength dispersive X-ray fluorescence spectroscopy, an X-ray beam produces similar characteristic X-ray radiation. These fluorescent radiations can be separated and quantified by applying Bragg's Law using various "analyzing crystals" and a specific optical geometry.
Today, synthetic multilayer analyzers have replaced natural crystals for WDS analysis. Rigaku was the first commercial producer of synthetic multilayer analyzers. Respected as the world leader in the continued development of multilayer technology for light element analysis, Rigaku offers its advanced Ovonyx™ product line for WDS. Ovonyx multilayers are used by nearly all OEM manufacturers of X-ray fluorescence (WDXRF) spectrometers, including Cameca, Jeol, Oxford, Philips, Shimadzu, Thermo ARL, and Thermo Noran.
Please contact Rigaku to request a copy of the available application notes for WDXRF spectroscopy optics.
