Ultima IV accessories

Optional attachments

HT 1500 high temperature attachment

Automated variable temperature stage for in-situ X-ray diffraction measurements of materials at elevated temperatures. The stage may be operated in air, gas, vacuum, or under liquid nitrogen cooling conditions. The sample is heated radiantly for reduced heat gradients within the sample. Automated z translation within the stage assures precise sample positioning even in the presence of thermal expansion of the sample.

 

Low & medium temperature attachment

Automated variable temperature stage for in-situ X-ray diffraction measurements of materials at elevated temperatures. The stage may be operated in air, gas, vacuum, or under liquid nitrogen cooling conditions. The sample is heated radiantly for reduced heat gradients within the sample. Automated z translation within the stage assures precise sample positioning even in the presence of thermal expansion of the sample.

 

Anton Paar domed hot Stage for thin films

System allows operating temperatures from room temperature to 900°C.
Allowed atmospheres are: Vacuum, air, inert gas.

 

Reactor X high temperature attachment for reactive gases

Reactor X allows measurements to be performed under high temperature (RT - 1000°C) in vacuum, inert gas, reactive gas, or mixture of these. Infrared heating enables rapid heating and cooling of the sample and use of wide variety of sample holders so that a suitable sample holder material can be selected according to the combination of the sample, gas, and applied temperature.

 

Advanced thin film attachment

Multipurpose attachment for the precise alignment of thin film samples. Fully automated alignment provides extreme ease in the positioning of samples for X-ray reflectivity, in-plane diffraction, and orientation analysis. Utilizes the R_x/R_y design for the most flexible reciprocal space scanning options.

 

MPA 4 open Eulerian cradle

Multipurpose open Eulerian cradle suitable for a wide range of measurements requiring generalized sample positioning. Applications including residual stress and texture are fully automated with dedicated data collection software for exceptional ease of use.

 

Small area attachment (Mapping stage)

Automated xyz stage with video monitoring for X-ray diffraction measurements from small areas on a sample surface.

 

DSC 350/550 differential scanning calorimetry attachment

Integrated DSC stage allows for simultaneous in-situ DSC and elevated temperature XRD measurements. Variable humidity and low temperature control are optional for hydration and low temperature XRD measurements.

 

VH350/550 variable humidity option for DSC 350/550

Variable humidity components and humidity generator/controller for DSC350/550

 

LT350/550 low temperature option for DSC 350/550

Low temperature components and controller for DSC 350/550

 

ASC-10 automatic 10-position sample changer with spinner

Automatic 10-position sample changer is compact and rugged. Integrated spinning improves particle statistics in polycrystalline sample measurements. Fully automatic alignment. Programmable

 

ASC-43 automatic sample changer

Automatic 43 position sample changer with magazine. Integrated spinning improves particle statistics in polycrystalline sample measurements. Fully automatic alignment. Programmable

 

Capillary attachment

Automated sample stage for use with glass capillary tubes. Includes sample-spinning capability. Unique design simplifies capillary alignment

 

 D/teX ultra high-speed position sensitive detector system

The D/teX ultra is the next generation in high speed XRD data collection. Advances in semiconductor device technology and electronic data processing methods have combined to make the D/teX ultra the world's fastest and most flexible silicon strip detector.