Mapping with XRF
Nondestructive elemental or layer thickness/composition analysis is
central to many analytical programs. Rigaku is unique in offering Wavelength
dispersive X-ray fluorescence (WD-XRF) instruments that can automatically
measure multiple small spots (down to 0.5 mm) on the surface of a sample and plot the results
as a chemical or phase map superimposed with the magnified visual image of
the sample. This technology is useful in many areas:
- Geology and mining - examining inclusions
- Alloy analysis - examining inclusions
- Thin film analysis
- R&D - anomaly detection
Click here to request a copy of the available application notes about mapping.