Research & development using XRF
Nondestructive elemental or layer thickness/composition analysis is central to many research and development programs. Wavelength dispersive X-ray fluorescence (WD-XRF) is one of the most selective and sensitive methodology to accomplish these analyses. In addition to exceptional precision and wide elemental coverage, XRF is non-destructive—allowing the sample to be preserved for subsequent study. Some of the feature & benefits of Rigaku's technology for R&D applications include:
- Inverted or standard optics depending on application
- Small sample analysis
- Mapping
- No digestion or wet chemistry prep
- Low detection limits
- Excellent light element sensitivity
- Analysis without standards (or few)
Please contact Rigaku to request a copy of the available application notes for R&D applications.